Of all of the component-level ESD tests available, the charged-device model (CDM) test is the closest to simulating real world events. CDM testing simulates ESD charging followed by a rapid discharge, ...
An electronic device is susceptible to Electrostatic Discharge (ESD) damage during its entire life cycle, including the phase from the completion of the silicon wafer processing to when the device ...
In addressing the challenges of enhancing ESD resilience for high-speed SerDes interfaces, it’s crucial to ensure the implementation of appropriate ESD protection measures. This is particularly vital ...
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