The field of reliability demonstration testing has evolved to address the challenges inherent in validating the performance of complex systems under practical constraints. Traditional methods, often ...

SAE International Journal of Materials and Manufacturing, Vol. 9, No. 2 (May 2016), pp. 303-314 (12 pages) ABSTRACT Durability and reliability performance is one of the most important concerns for ...

Environmentally friendly is a term rapidly invading the electronics industry. The electronic industry will be facing great challenges over the next few years as the solder used in electronic products ...

As technology shrinks, Yield and Reliability (YAR) are major challenges of SoC (System on Chip) production. There are many techniques available for increasing YAR. YAR of devices depend on testing ...

Undaunted by the skyrocketing costs of new semiconductor fabs and the formidable hurdles facing the industry with each new technology node, leading IC manufacturers are continuing to strive for ...

Congratulations to alumnus Bryan Root (ElEngr’84), who was recently elevated to Institute of Electrical and Electronics Engineers Fellow for leadership in improving semiconductor reliability test ...

iNEMI (International Electronics Manufacturing Initiative) has begun driving two collaborative efforts that will focus on reliability and testing issues for MEMS technologies. Using information ...

Apple is developing a method to provide better quality control for microLED displays, which carry a number of benefits over OLED and could be used in future devices like an Apple Watch or iPhone.

The feasibility, validity and reliability of the Time Trade-Off (TTO) and Visual Analogue Scale (VAS) methods in obtaining preference values for health states were compared in a random sample of the ...